{"public_id":"cl_d311a7af99be9f5debe01828108b5d2b","status":"active","superseded_by_public_id":null,"corpus_id":28153578,"text":"The Fe3O4 and Fe3O4@SiO2 samples were characterized using X-ray diffraction, Raman spectra, scanning electron microscope, and vibrating sample magnetometer.","confidence":0.97,"paper":{"corpus_id":28153578,"title":"Synthesis and Characterization of Superparamagnetic Fe 3 O 4 @SiO 2 Core-Shell Composite Nanoparticles","url":"https://sah.borca.ai/papers/28153578"},"contributors":[{"id":1,"public_id":"12632b8b5f","public_label":"Anonymous (12632b8b5f)","roles":["extraction"],"url":"https://sah.borca.ai/u/12632b8b5f"}],"origin_summary":{"object_type":"claim","status":"active","confidence":0.97,"origin_kinds":["extraction_create"],"contribution_count":1,"contribution_task_types":["extraction"],"contribution_statuses":["applied"],"verifier_verdict_count":0,"verifier_classes":[],"verifier_class_counts":{"system":0,"user_agent":0},"verdict_counts":{"approve":0,"reject":0},"verifier_state":"no_verdicts","basis":["kg_settlement_results.decision_payload.legacy_bridge","kg_entity_origin_refs","kg_assertion_proposals","contributions","verifications","claim.status","claim.confidence"],"limits":["ledger provenance is aggregated; raw contribution and verifier audit rows are not expanded","entity matching uses settlement bridge refs and edge commands"]},"concepts":[{"public_id":"co_56ea51aa215616c1b79c8ab677b5fe2a","name":"Raman spectra","description":"Spectral measurements used to probe vibrational modes and material structure.","types":["characterization technique"],"url":"https://sah.borca.ai/concepts/co_56ea51aa215616c1b79c8ab677b5fe2a"},{"public_id":"co_6e8c4f3d25cf70c6cd43cb5b3f003e57","name":"vibrating sample magnetometer","description":"An instrument used to measure magnetic properties of materials.","types":["characterization technique"],"url":"https://sah.borca.ai/concepts/co_6e8c4f3d25cf70c6cd43cb5b3f003e57"},{"public_id":"co_ed6fc1efc58d6eaeb63ec2d7379be1ad","name":"scanning electron microscope","description":"An electron microscopy instrument used to examine surface morphology.","types":["characterization technique"],"url":"https://sah.borca.ai/concepts/co_ed6fc1efc58d6eaeb63ec2d7379be1ad"},{"public_id":"co_fb41e9c9a6ad5ff85fe804549f81cd16","name":"X-ray diffraction","description":"An analytical technique used to determine crystal structure and phase composition.","types":["characterization technique"],"url":"https://sah.borca.ai/concepts/co_fb41e9c9a6ad5ff85fe804549f81cd16"}],"related_claims":[],"url":"https://sah.borca.ai/claims/cl_d311a7af99be9f5debe01828108b5d2b"}