A fully integrated near‐field optical, far‐field optical, and normal‐force scanned probe microscope

K. Lieberman,N. Ben-Ami,A. Lewis

Published 1996 in Review of Scientific Instruments

ABSTRACT

No abstract is available for this paper.

PUBLICATION RECORD

  • Publication year

    1996

  • Venue

    Review of Scientific Instruments

  • Publication date

    1996-10-01

  • Fields of study

    Physics, Engineering

  • Identifiers
  • External record

    Open on Semantic Scholar

  • Source metadata

    Semantic Scholar

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