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A fully integrated near‐field optical, far‐field optical, and normal‐force scanned probe microscope
K. Lieberman,N. Ben-Ami,A. Lewis
Published 1996 in Review of Scientific Instruments
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- Publication year
1996
- Venue
Review of Scientific Instruments
- Publication date
1996-10-01
- Fields of study
Physics, Engineering
- Identifiers
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Semantic Scholar
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