Crystalline to amorphous transition and band structure evolution in ion-damaged silicon studied by spectroscopic ellipsometry

No abstract is available for this paper.

• Publication year

  2001

• Venue

  Journal of Applied Physics

• Publication date

  2001-06-29

• Fields of study

  Materials Science, Physics, Engineering

• Identifiers
  DOI 10.1063/1.1379055
• External record

  Open on Semantic Scholar

• Source metadata

  Semantic Scholar

• No claims are published for this paper.

• No concepts are published for this paper.

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