Optical characterization of textured SnO2:F layers using spectroscopic ellipsometry

No abstract is available for this paper.

• Publication year

  2012

• Venue

  Journal of Applied Physics

• Publication date

  2012-10-17

• Fields of study

  Materials Science, Physics

• Identifiers
  DOI 10.1063/1.4759054
• External record

  Open on Semantic Scholar

• Source metadata

  Semantic Scholar

• No claims are published for this paper.

• No concepts are published for this paper.

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