Testing and Ranking Multiple Wafer-Manufacturing Processes With Fuzzy-Quality Data

No abstract is available for this paper.

• Publication year

  2016

• Venue

  Journal of Testing and Evaluation

• Publication date

  2016-02-02

• Fields of study

  Mathematics, Engineering

• Identifiers
  DOI 10.1520/JTE20150262
• External record

  Open on Semantic Scholar

• Source metadata

  Semantic Scholar

• No claims are published for this paper.

• No concepts are published for this paper.

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