Note: Quantitative (artifact-free) surface potential measurements using Kelvin force microscopy.

No abstract is available for this paper.

• Publication year

  2011

• Venue

  Review of Scientific Instruments

• Publication date

  2011-03-03

• Fields of study

  Materials Science, Physics, Medicine, Engineering

• Identifiers
  DOI 10.1063/1.3516046PMID 21456803
• External record

  Open on Semantic Scholar

• Source metadata

  Semantic Scholar, PubMed

• No claims are published for this paper.

• No concepts are published for this paper.

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