Effects of loading rate and temperature on domain switching and evolutions of reference remnant state variables during polarization reversal in a PZT wafer

No abstract is available for this paper.

• Publication year

  2012

• Venue

  Ceramics International

• Publication date

  2012-03-01

• Fields of study

  Materials Science, Physics, Engineering

• Identifiers
  DOI 10.1016/J.CERAMINT.2011.08.039
• External record

  Open on Semantic Scholar

• Source metadata

  Semantic Scholar

• No claims are published for this paper.

• No concepts are published for this paper.

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