Intelligent sampling for the measurement of structured surfaces

No abstract is available for this paper.

• Publication year

  2012

• Venue

  Measurement Science and Technology

• Publication date

  2012-07-10

• Fields of study

  Physics, Computer Science, Engineering

• Identifiers
  DOI 10.1088/0957-0233/23/8/085006
• External record

  Open on Semantic Scholar

• Source metadata

  Semantic Scholar

• No claims are published for this paper.

• No concepts are published for this paper.

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