No abstract is available for this paper.
Patent citation indicators: One size fits all?
Jurriën Bakker,D. Verhoeven,Lin Zhang,B. Looy
Published 2015 in Scientometrics
ABSTRACT
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- Publication year
2015
- Venue
Scientometrics
- Publication date
Unknown publication date
- Fields of study
Business, Economics, Computer Science
- Identifiers
- External record
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Semantic Scholar
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