General-purpose image forensics using patch likelihood under image statistical models

Wei Fan,K. Wang,François Cayre

Published 2015 in International Workshop on Information Forensics and Security

ABSTRACT

No abstract is available for this paper.

PUBLICATION RECORD

  • Publication year

    2015

  • Venue

    International Workshop on Information Forensics and Security

  • Publication date

    2015-11-01

  • Fields of study

    Computer Science

  • Identifiers
  • External record

    Open on Semantic Scholar

  • Source metadata

    Semantic Scholar

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