Bayesian hierarchical model for combining misaligned two-resolution metrology data

No abstract is available for this paper.

• Publication year

  2011

• Venue

  IIE Transactions

• Publication date

  2011-01-31

• Fields of study

  Engineering

• Identifiers
  DOI 10.1080/0740817X.2010.521804
• External record

  Open on Semantic Scholar

• Source metadata

  Semantic Scholar

• No claims are published for this paper.

• No concepts are published for this paper.

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