Multiscaling analysis of ferroelectric domain wall roughness.

Using multiscaling analysis, we compare the characteristic roughening of ferroelectric domain walls in Pb(Zr0.2Ti0.8)O3 thin films with numerical simulations of weakly pinned one-dimensional interfaces. Although at length scales up to L(MA)≥5  μm the ferroelectric domain walls behave similarly to the numerical interfaces, showing a simple monoaffine scaling (with a well-defined roughness exponent ζ), we demonstrate more complex scaling at higher length scales, making the walls globally multiaffine (varying ζ at different observation length scales). The dominant contributions to this multiaffine scaling appear to be very localized variations in the disorder potential, possibly related to dislocation defects present in the substrate.

• Publication year

  2012

• Venue

  Physical Review Letters

• Publication date

  2012-05-01

• Fields of study

  Medicine, Materials Science, Physics

• Identifiers
  DOI 10.1103/PhysRevLett.109.147601arXiv 1205.0155PMID 23083287
• External record

  Open on Semantic Scholar

• Source metadata

  Semantic Scholar, PubMed

• No claims are published for this paper.

• No concepts are published for this paper.

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