Advanced spectroscopic technique for the study of nanocontainers: atomic force microscopy-infrared spectroscopy (AFM-IR)

Abstract The emergence of a large number of nanomaterials makes it urgent to develop characterization techniques at the nanoscale. Rapidly emerging techniques, such as atomic force microscopy-infrared spectroscopy (AFM-IR), combining atomic force microscopy with infrared spectroscopy, provide scientists with means of chemical analysis and compositional imaging at the nanoscale. The chapter briefly reviews the main developments of AFM-IR in terms of its spatial resolution, highlighting the resonance enhanced AFM-IR and tapping AFM-IR, followed by detailed measurements of AFM-IR, including its spectrum acquiring, chemical imaging and measurements of mechanical and thermal properties of materials. The chapter then surveys and discusses a wide range of applications of AFM-IR for the study of nanocontainers such as, studying coatings, drug-polymer blends, drug-loading lipid-polymer membranes, metal-organic frameworks, and lipid or polymer vesicles.

• Publication year

  2020

• Venue

  Unknown venue

• Publication date

  Unknown publication date

• Fields of study

  Chemistry, Materials Science, Physics

• Identifiers
  DOI 10.1016/b978-0-12-816770-0.00002-2
• External record

  Open on Semantic Scholar

• Source metadata

  Semantic Scholar

• No claims are published for this paper.

• No concepts are published for this paper.

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