Optical Pump Rectification Emission: Route to Terahertz Free-Standing Surface Potential Diagnostics

We introduce a method for diagnosing the electric surface potential of a semiconductor based on THz surface generation. In our scheme, that we name Optical Pump Rectification Emission, a THz field is generated directly on the surface via surface optical rectification of an ultrashort pulse after which the DC surface potential is screened with a second optical pump pulse. As the THz generation directly relates to the surface potential arising from the surface states, we can then observe the temporal dynamics of the static surface field induced by the screening effect of the photo-carriers. Such an approach is potentially insensitive to bulk carrier dynamics and does not require special illumination geometries.

• Publication year

  2017

• Venue

  Scientific Reports

• Publication date

  2017-08-29

• Fields of study

  Materials Science, Physics, Medicine

• Identifiers
  DOI 10.1038/s41598-017-08734-zPMID 28851895PMCID 5575250
• External record

  Open on Semantic Scholar

• Source metadata

  Semantic Scholar, PubMed

• No claims are published for this paper.

• No concepts are published for this paper.

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