Simultaneous scanning tunneling microscopy and synchrotron X-ray measurements in a gas environment.

Rik V. Mom,W. Onderwaater,M. Rost,M. Jankowski,S. Wenzel,L. Jacobse,P. Alkemade,V. Vandalon,M. V. van Spronsen,Matthijs van Weeren,Bert Crama,P. van der Tuijn,R. Felici,W. Kessels,F. Carlá,J. Frenken,I. Groot

Published 2017 in Ultramicroscopy

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