Fast measurement of surface defects on large components with dynamic phase-shifting digital holographic microscopy

No abstract is available for this paper.

• Publication year

  2023

• Venue

  Measurement

• Publication date

  2023-02-01

• Fields of study

  Not labeled

• Identifiers
  DOI 10.1016/j.measurement.2023.112443
• External record

  Open on Semantic Scholar

• Source metadata

  Semantic Scholar

• No claims are published for this paper.

• No concepts are published for this paper.

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