Single-crystal Raman spectroscopy and X-ray crystallography at beamline X26-C of the NSLS

The collection of absorption and Raman spectroscopic data correlated with X-ray diffraction data allows investigators to understand the atomic structure as well as the electronic and vibrational characteristics of their samples, to identify transiently formed intermediates and to explore mechanistic questions. Raman spectroscopy instrumentation at beamline X26-C at the NSLS is currently available to the general user population.

• Publication year

  2010

• Venue

  Journal of Synchrotron Radiation

• Publication date

  2010-11-05

• Fields of study

  Materials Science, Physics, Chemistry, Medicine

• Identifiers
  DOI 10.1107/S0909049510033601PMID 21169688PMCID 3004251
• External record

  Open on Semantic Scholar

• Source metadata

  Semantic Scholar, PubMed

• No claims are published for this paper.

• No concepts are published for this paper.

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