Robust Methods for Deep-Learning Training

Yanjing Li,V. Reddi

Published 2025 in IEEE design & test

ABSTRACT

Editor’s notes: This article investigates the impact of hardware failures on deep-neuralnetwork training, discusses error detection and recovery strategies, and highlights key challenges for the future. —Jyotika Athavale, Synopsys, USA —Haralampos-G. Stratigopoulos, Sorbonne Université, CNRS, LIP6, France

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