Puzzle mode graph learning with pattern composition relationships reasoning for defect detection of printed products

No abstract is available for this paper.

• Publication year

  2025

• Venue

  Journal of manufacturing systems

• Publication date

  2025-08-01

• Fields of study

  Not labeled

• Identifiers
  DOI 10.1016/j.jmsy.2025.05.013
• External record

  Open on Semantic Scholar

• Source metadata

  Semantic Scholar

• No claims are published for this paper.

• No concepts are published for this paper.

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