Atomic-level engineering of phase change material for novel fast-switching and high-endurance PCM for storage class memory application

Huai-Yu Cheng,M. BrightSky,S. Raoux,C. Chen,P. Du,Jau-Yi Wu,Yu-Yu Lin,T. Hsu,Y. Zhu,Seong-Dong Kim,C. M. Lin,A. Ray,H. Lung,C. Lam

Published 2013 in 2013 IEEE International Electron Devices Meeting

ABSTRACT

No abstract is available for this paper.

PUBLICATION RECORD

  • Publication year

    2013

  • Venue

    2013 IEEE International Electron Devices Meeting

  • Publication date

    2013-12-01

  • Fields of study

    Materials Science, Computer Science, Engineering

  • Identifiers
  • External record

    Open on Semantic Scholar

  • Source metadata

    Semantic Scholar

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