No abstract is available for this paper.
Atomic-level engineering of phase change material for novel fast-switching and high-endurance PCM for storage class memory application
Huai-Yu Cheng,M. BrightSky,S. Raoux,C. Chen,P. Du,Jau-Yi Wu,Yu-Yu Lin,T. Hsu,Y. Zhu,Seong-Dong Kim,C. M. Lin,A. Ray,H. Lung,C. Lam
Published 2013 in 2013 IEEE International Electron Devices Meeting
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- Publication year
2013
- Venue
2013 IEEE International Electron Devices Meeting
- Publication date
2013-12-01
- Fields of study
Materials Science, Computer Science, Engineering
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