Helium ion microscopy of graphene: beam damage, image quality and edge contrast

D. Fox,Yangbo Zhou,A. O’Neill,Shishir Kumar,Jing Jing Wang,Jonathan N. Coleman,G. Duesberg,J. Donegan,Hongzhou Zhang

Published 2013 in Nanotechnology

ABSTRACT

No abstract is available for this paper.

PUBLICATION RECORD

CITATION MAP

EXTRACTION MAP

CLAIMS

  • No claims are published for this paper.

CONCEPTS

  • No concepts are published for this paper.

REFERENCES

Showing 1-34 of 34 references · Page 1 of 1

CITED BY

Showing 1-94 of 94 citing papers · Page 1 of 1