No abstract is available for this paper.
Helium ion microscopy of graphene: beam damage, image quality and edge contrast
D. Fox,Yangbo Zhou,A. O’Neill,Shishir Kumar,Jing Jing Wang,Jonathan N. Coleman,G. Duesberg,J. Donegan,Hongzhou Zhang
Published 2013 in Nanotechnology
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- Publication year
2013
- Venue
Nanotechnology
- Publication date
2013-08-23
- Fields of study
Medicine, Materials Science, Physics
- Identifiers
- External record
- Source metadata
Semantic Scholar, PubMed
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