Fault isolation by test scheduling for embedded systems using a probabilistic approach

No abstract is available for this paper.

• Publication year

  2013

• Venue

  Journal of Intelligent Manufacturing

• Publication date

  2013-10-28

• Fields of study

  Computer Science, Engineering

• Identifiers
  DOI 10.1007/s10845-015-1088-7
• External record

  Open on Semantic Scholar

• Source metadata

  Semantic Scholar

• No claims are published for this paper.

• No concepts are published for this paper.

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