Angle-resolved ellipsometry of scattering patterns from arbitrary surfaces and bulks.

Accurate angular phase data are extracted from angle-resolved scattering measurements made with polarized light using a technique developed in the laboratory. This Ellipsometry of Angle-Resolved Scattering (E.A.R.S.) technique makes it possible to distinguish surface scattering from bulk scattering independent of the scattering levels for different types of samples. Phase data are also investigated in the speckle pattern.

• Publication year

  2005

• Venue

  Optics Express

• Publication date

  2005-04-04

• Fields of study

  Materials Science, Physics, Medicine

• Identifiers
  DOI 10.1364/OPEX.13.002403PMID 19495131
• External record

  Open on Semantic Scholar

• Source metadata

  Semantic Scholar, PubMed

• No claims are published for this paper.

• No concepts are published for this paper.

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