Short critical area model and extraction algorithm based on defect characteristics in integrated circuits

No abstract is available for this paper.

• Publication year

  2016

• Venue

  Analog Integrated Circuits and Signal Processing

• Publication date

  2016-08-22

• Fields of study

  Computer Science, Engineering

• Identifiers
  DOI 10.1007/s10470-016-0841-y
• External record

  Open on Semantic Scholar

• Source metadata

  Semantic Scholar

• No claims are published for this paper.

• No concepts are published for this paper.

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