HATBED: a distributed hardware assisted testbed for non-invasive profiling of IoT devices

Embedded networked sensor systems are deeply coupled with the physical world, and the deployed systems are usually difficult to debug. Therefore, it is especially important to thoroughly test and profile the systems before deploying to the real world. Traditional debugging methods are incompetent for detailed tracing on resource constrained devices due to their intrusiveness. This paper proposes alow-cost Hardware Assisted Tracing testBED (HATBED) to enable non-intrusive tracing and profiling for embedded networked sensor systems independent of operating systems and applications. We hope HATBED will foster research on comprehensive testing and profiling of embedded networked systems based on modern 32-bit architecture.

• Publication year

  2019

• Venue

  Bench@CPSIoTWeek

• Publication date

  2019-04-15

• Fields of study

  Computer Science, Engineering, Environmental Science

• Identifiers
  DOI 10.1145/3312480.3313172
• External record

  Open on Semantic Scholar

• Source metadata

  Semantic Scholar

• No claims are published for this paper.

• No concepts are published for this paper.

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