"Multidimensional reflectometry for industry" (xD-Reflect) an European research project

A. Höpe,A. Koo,F. Martínez-Verdú,F. Leloup,G. Obein,G. Wübbeler,Joaquín Campos,P. Iacomussi,P. Jaanson,S. Källberg,M. Šmíd

Published 2014 in Electronic imaging

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