Sub-wavelength surface IR imaging of soft-condensed matter

Outlined here is a technique for sub-wavelength infrared surface imaging performed using a phase matched optical parametric oscillator laser and an atomic force microscope as the detection mechanism. The technique uses a novel surface excitation illumination approach to perform simultaneously chemical mapping and AFM topography imaging with an image resolution of 200 nm. This method was demonstrated by imaging polystyrene micro-structures.

• Publication year

  2010

• Venue

  European Physical Journal-applied Physics

• Publication date

  2010-08-01

• Fields of study

  Materials Science, Physics, Chemistry

• Identifiers
  DOI 10.1051/epjap/2010093arXiv 1010.5929
• External record

  Open on Semantic Scholar

• Source metadata

  Semantic Scholar

• No claims are published for this paper.

• No concepts are published for this paper.

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