Field emission scanning electron and atomic force microscopy, and Raman and X-ray photoelectron spectroscopy characterization of near-isogenic soft and hard wheat kernels and corresponding flours

No abstract is available for this paper.

• Publication year

  2010

• Venue

  Journal of Cereal Science

• Publication date

  2010-09-01

• Fields of study

  Agricultural and Food Sciences, Materials Science

• Identifiers
  DOI 10.1016/J.JCS.2010.04.005
• External record

  Open on Semantic Scholar

• Source metadata

  Semantic Scholar

• No claims are published for this paper.

• No concepts are published for this paper.

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