Review of Present Reliability Challenges in Amorphous In-Ga-Zn-O Thin Film Transistors

No abstract is available for this paper.

• Publication year

  2014

• Venue

  ECS Journal of Solid State Science and Technology

• Publication date

  Unknown publication date

• Fields of study

  Materials Science, Physics, Engineering

• Identifiers
  DOI 10.1149/2.013409JSS
• External record

  Open on Semantic Scholar

• Source metadata

  Semantic Scholar

• No claims are published for this paper.

• No concepts are published for this paper.

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