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Control of particulate processes by optical measurement techniques
C. Heffels,R. Polke,M. Rädle,B. Sachweh,M. Schäfer,N. Scholz
Published 1998 in Particle & Particle Systems Characterization
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- Publication year
1998
- Venue
Particle & Particle Systems Characterization
- Publication date
1998-10-01
- Fields of study
Chemistry, Materials Science, Physics, Engineering
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Semantic Scholar
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