{"corpus_id":27012202,"paper_sha":"7b810fea0f2bb4e3248a6ee1370175348949f7d0","doi":"10.1109/EDL.1982.25502","arxiv_id":null,"pmid":null,"pmcid":null,"mag_id":2149955678,"dblp_id":null,"acl_id":null,"title":"Obtaining the specific contact resistance from transmission line model measurements","year":1982,"publication_date":"1982-05-01","venue":"IEEE Electron Device Letters","journal":{"name":"IEEE Electron Device Letters","pages":"111-113","volume":"3"},"journal_issn":null,"journal_title":null,"publication_types":[],"pubmed_pub_types":null,"s2_fields_of_study":["Materials Science","Physics","Engineering"],"reference_count":5,"citation_count":958,"influential_citation_count":39,"is_open_access":false,"arxiv_categories":null,"arxiv_license":null,"arxiv_journal_ref":null,"mesh_headings":null,"chemicals":null,"comments_corrections":null,"source_flags":1,"s2_open_access_pdf_url":null,"s2_open_access_landing_url":null,"s2_open_access_license":null,"s2_open_access_status":null,"pmc_open_access_pdf_url":null,"pmc_open_access_landing_url":null,"pmc_open_access_license":null,"pmc_open_access_status":null,"unpaywall_open_access_pdf_url":null,"unpaywall_open_access_landing_url":null,"unpaywall_open_access_license":null,"unpaywall_open_access_status":null,"abstract":"In characterizing ohmic contacts using the transmission line model, it is necessary to make a measurement referred to as the contact end resistance, as a result of modification to the sheet resistance under the contact. 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