A. Benninghoven

The development of SIMS and international SIMS conferences: a personal retrospective view
201113 citationsauthor #1
A Static‐Secondary‐Ion‐Mass‐Spectrometry study of the surfaces of poly(hydroxyalkyl methacrylates) before and after chemical modification
20103 citationsauthor #4
SIMS method of material wear diagnosis
20091 citationsauthor #1
Diffuse Reflectance IR and Time‐of‐Flight SIMS Investigation of Methoxysilane SA‐Layers on Silica and Alumina
20080 citationsauthor #3
Thick Siloxane Films from Tetraethoxysilane on Silicon Wafers
20080 citationsauthor #5
Spectroscopic Investigations on Silylated Inorganic Substrates
20080 citationsauthor #3
CCall—Healthy and Successful Work in Call Centres
200512 citationsauthor #1
Nonresonant Laser–SNMS and TOF–SIMS analysis of sub-μm structures
200321 citationsauthor #4
Antioxidant segregation and crystallisation at polyester surfaces studied by ToF-SIMS
200321 citationsauthor #2
Resonance and nonresonant laser ionization of sputtered uranium atoms from thin films and single microparticles: evaluation of a combined system for particle trace analysis.
200315 citationsauthor #4
Molecular secondary ion emission from adenine overlayers in dependence on the primary ion species and substrate material
20036 citationsauthor #3
TOF-SIMS depth profiling of SIMON
20031 citationsauthor #6
Evaluation of a system for trace and particle analysis based on resonance ionization of sputtered atoms
20020 citationsauthor #2
High performance liquid chromatography and time-of-flight secondary ion mass spectrometry : a new dimension in structural analysis of apolipoproteins HU
20020 citationsauthor #4
TLC—TOF SIMS Monitoring of Zinc Complex Origin — Carboxylate Ligand Movement
20022 citationsauthor #3
Quantitative surface analysis of molecular overlayers by resonantly enhanced multiphoton ionization of sputtered molecules
20020 citationsauthor #4
Molecular secondary particle emission from molecular overlayers under 10 keV Ar+ primary ion bombardment
200116 citationsauthor #3
Static time‐of‐flight secondary ion mass spectrometry and x‐ray photoelectron spectroscopy characterization of adsorbed albumin and fibronectin films
2001119 citationsauthor #7
Structural Analysis of Human Apolipoprotein A-I Variants
20013 citationsauthor #5
Secondary ion emission from phosphatidic acid sandwich films under atomic and molecular primary ion bombardment
20013 citationsauthor #2
Application of atomic and molecular primary ions for TOF–SIMS analysis of additive containing polymer surfaces
200126 citationsauthor #2
Detection and quantification of metals in organic materials by laser-SNMS with nonresonant multiphoton ionization.
20005 citationsauthor #2
Secondary ion emission from molecular overlayers: Thiols on gold
200021 citationsauthor #3
Secondary ion emission from polymethacrylate LB-layers under 0.5–11 keV atomic and molecular primary ion bombardment
200035 citationsauthor #3
Imaging of Domain Structures in a One-Component Lipid Monolayer by Time-of-Flight Secondary Ion Mass Spectrometry
200034 citationsauthor #3
Secondary ion emission from arachidic acid LB-layers under Ar+, Xe+, Ga+ and SF5+ primary ion bombardment
199947 citationsauthor #3
Combined ToF-SIMS/XPS study of plasma modification and metallization of polyimide
199939 citationsauthor #7
Chemical characterization of modified nanotips by TOF-SIMS and Laser-SNMS
19990 citationsauthor #6
Determination of silicon oxide layer thickness by time-of-flight secondary ion mass spectroscopy
19994 citationsauthor #4
Ultrashallow secondary ion mass spectroscopy depth profiling of doping spikes and Si/SiGe/Si heterostructures using different primary species
19987 citationsauthor #5
Study of molecular surface diffusion by imaging static secondary ion mass spectrometry (SIMS): polymers on Ag-surfaces
199812 citationsauthor #4
Investigation of electron induced damaging of molecular overlayers by imaging static secondary ion mass spectroscopy
19984 citationsauthor #5
Quantification of metal contaminants on GaAs with time-of-flight secondary ion mass spectrometry
19988 citationsauthor #7
Ultra-shallow junction depth profile analysis using TOF-SIMS and TXRF
19983 citationsauthor #4
Secondary ion mass spectrometry depth profiling of ultralow-energy ion implants: Problems and solutions
199816 citationsauthor #6
Secondary ion emission from polymer surfaces under Ar+, Xe+ and SF5+ ion bombardment
1998158 citationsauthor #2
Porous silicon: repeatability of generation?
19983 citationsauthor #4
Optimized time-of-flight secondary ion mass spectroscopy depth profiling with a dual beam technique
1997103 citationsauthor #3
An improved method for quantification of cholesterol and cholesteryl esters in human monocyte-derived macrophages by high performance liquid chromatography with identification of unassigned cholesteryl ester species by means of secondary ion mass spectrometry.
199753 citationsauthor #7
Molecular weight determination of bulk polymer surfaces by static secondary ion mass spectrometry
19978 citationsauthor #5
Examination of organosilicon impregnating mixtures by static SIMS and diffuse reflectance FT-IR
19973 citationsauthor #5
Secondary ion mass spectrometry : SIMS X : Proceedings of the Tenth International Conference on Secondary Ion Mass Spectrometry (SIMS X) : University of Muenster, Muenster, Germany October 1-6th, 1995
19970 citationsauthor #1
Imaging time-of-flight secondary ion mass spectrometry allows visualization and analysis of coexisting phases in Langmuir-Blodgett films
199635 citationsauthor #3
TOF-SIMS studies of adsorbed protein films
19960 citationsauthor #7
Adsorbed protein configuration and orientation probed by ESCA and time-of-flight SIMS
19960 citationsauthor #7
Surface segregation in poly(styrene-b-isoprene): Correlation of TOF-SIMS with XPS and contact angle measurements
19960 citationsauthor #9
Quantification of metal trace contaminants on Si wafer surfaces by Laser‐SNMS and TOF‐SIMS using sputter deposited submonolayer standards
199622 citationsauthor #6
Method for determination of depth profiles in the thin film region
19960 citationsauthor #1
Surface analysis of PP/EVA blends modified with amino acids for biomedical applications
19954 citationsauthor #5
Smith-Lemli-Opitz Syndrome Diagnosed by Using Time-of-Flight Secondary-Ion
19950 citationsauthor #9
Analysis and classification of individual outdoor aerosol particles with SIMS time-of-flight mass spectrometry
199513 citationsauthor #6
Smith-Lemli-Opitz syndrome diagnosed by using time-of-flight secondary-ion mass spectrometry.
199521 citationsauthor #9
Novel sophorose lipids from microbial conversion of 2-alkanols
199534 citationsauthor #5
Chemisorption of poly(methylhydrogensiloxane) on oxide surfaces: a quantitative investigation using static SIMS
199511 citationsauthor #6
Secondary ion mass spectrometry : SIMS IX : Proceedings of the Ninth International Conference on Secondary Ion Mass Spectrometry (SIMS IX) : the Hotel Yokohama and the Sangyo-Boeki Center Building Yokohama, Japan 7-12 November, 1993
19944 citationsauthor #1
Radiation effects in static SIMS of polymers
19944 citationsauthor #4
Surface analysis by Secondary Ion Mass Spectrometry (SIMS)
1994152 citationsauthor #1
Correction of dead time effects in time‐of‐flight mass spectrometry
199495 citationsauthor #3
Surface analysis of polymer materials by secondary ion mass spectrometry
19942 citationsauthor #1
Static SIMS investigation of immobilized molecules on polymer surfaces
199417 citationsauthor #3
Surface investigations of silylated substrates by TOF‐SIMS
19948 citationsauthor #2
Chlorine's effects on triazole inhibitor layers on copper
19945 citationsauthor #9
COMBINED INSTRUMENT FOR THE ON-LINE INVESTIGATION OF PLASMA DEPOSITED OR ETCHED SURFACES BY MONOCHROMATIZED X-RAY PHOTOELECTRON SPECTROSCOPY AND TIME- OF-FLIGHT SECONDARY ION MASS SPECTROMETRY
19943 citationsauthor #9
Effect of Ga+ backscattering in static SIMS
19940 citationsauthor #4
TOF-SIMS and FT-IR investigations of surface modified silicon wafers — porous silicon
19941 citationsauthor #5
In situ ToF‐SIMS/XPS investigation of nitrogen plasma‐modified polystyrene surfaces
199466 citationsauthor #5
Analysis of stoichiometry and oxide growth of HF treated GaAs (100) by x‐ray photoelectron spectroscopy and time‐of‐flight secondary ion mass spectrometry
199415 citationsauthor #7
Chemical Analysis of Inorganic and Organic Surfaces and Thin Films by Static Time‐of‐Flight Secondary Ion Mass Spectrometry (TOF‐SIMS)
1994462 citationsauthor #1
Comparative in situ ToF‐SIMS/XPS study of polystyrene modified by argon, oxygen and nitrogen plasmas
199430 citationsauthor #5
Combined depth profile analysis with SNMS, SIMS and XPS: Preferential sputtering and oxygen transport in binary metal oxide multilayer systems
199412 citationsauthor #5
XPS and SIMS/SNMS measurements on thin metal oxide layers
19939 citationsauthor #4
Surface MS: Probing Real-World Samples
199385 citationsauthor #1
Dimerization of polystyrene during static SIMS measurements
19937 citationsauthor #4
Time-of-flight secondary ion mass spectrometry investigations of self-assembled monolayers of organic thiols, sulfides, and disulfides on gold surfaces
199348 citationsauthor #2
Secondary ion emission from perfluorinated polyethers using megaelectronvolt and kiloelectronvolt ion bombardment
199311 citationsauthor #4
Comparative investigations of the secondary ion emission of metal complexes under MeV and keV ion bombardment
19933 citationsauthor #4
Time-of-flight secondary ion mass spectrometry of poly(alkyl methacrylates)
199332 citationsauthor #3
Time-of-flight secondary ion mass spectrometric analysis of polymer surfaces and additives
199341 citationsauthor #8
Sputtered neutrals mass spectrometry of organic molecules using multiphoton postionization
199214 citationsauthor #4
Analysis of Langmuir-Blodgett overlayers by time-of-flight secondary ion mass spectrometry (TOF-SIMS)
199232 citationsauthor #3
Secondary ion mass spectrometry : SIMS VIII : Proceedings of the Eighth International Conference on Secondary Ion Mass Spectrometry (SIMS VIII)
199234 citationsauthor #1
Quantification of molecular secondary ion mass spectrometry by internal standards
199213 citationsauthor #4
Analysis of passivating oxide and surface contaminants on GaAs (100) by temperature‐dependent and angle resolved x‐ray photoelectron spectroscopy, and time‐of‐flight secondary ion mass spectrometry
19928 citationsauthor #5
Characterization of Langmuir-Blodgett overlayers by time-of-flight secondary ion mass spectrometry
19929 citationsauthor #2
High Mass Resolution Plasma Desorption and Secondary Ion Mass Spectrometry of Neutral Nickel Thiolate Complexes. Crystal Structure of [Ni6(SC3H7)12]
199210 citationsauthor #4
High‐spatial‐resolution surface imaging of inorganic and organic structures by multiphoton post‐ionization of sputtered neutrals and time‐of‐flight mass spectrometry
199235 citationsauthor #4
High-resolution TOF-SIMS studies of substituted polystyrenes
199222 citationsauthor #7
Resonant photoionization of sputtered organic molecules by femtosecond UV laser pulses
199220 citationsauthor #4
Analytical surface spectroscopy of phospholipid Langmuir-Blodgett films
19926 citationsauthor #5
Formation of Very Large Gold Superclusters (Clusters of Clusters) as Secondary Ions up to (Au13)55 by Secondary Ion Mass Spectrometry.
19911 citationsauthor #4
Comparative and complementary plasma desorption mass spectrometry/secondary ion mass spectrometry investigations of polymer materials
199131 citationsauthor #4
High mass resolution surface imaging with a time‐of‐flight secondary ion mass spectroscopy scanning microprobe
199186 citationsauthor #7
Quantitative time‐of‐flight secondary ion mass spectrometry of a perfluorinated polyether
199120 citationsauthor #4
Time‐of‐flight static secondary ion mass spectrometry of additives on polymer surfaces
199111 citationsauthor #6
Analysis of ionic metal complexes by time-of-flight secondary ion mass spectrometry and plasma desorption mass spectrometry
19912 citationsauthor #4
Site-specific methionine sulfoxide formation is the structural basis of chromatographic heterogeneity of apolipoproteins A-I, C-II, and C-III.
199175 citationsauthor #5
Depth profile analysis of Pt, Cu, and Au overlayers on p-Hg1−xCdxTe
19911 citationsauthor #4
Surface characterization of carbon-supported iron catalysts for carbon monoxide hydrogenation: Influence of catalyst distribution and coal minerals
199112 citationsauthor #4
Molecular weight distributions of polymers using time-of-flight secondary-ion mass spectrometry
199171 citationsauthor #6
Combined chemical and surface analytical investigation of the calcium catalyzed coal gasification process
19915 citationsauthor #4

PROFILE

PAPERS

TIMELINE

COAUTHOR MAP

CONCEPT FOOTPRINT