NEW STRONG-LINE ABUNDANCE DIAGNOSTICS FOR H ii REGIONS: EFFECTS OF κ-DISTRIBUTED ELECTRON ENERGIES AND NEW ATOMIC DATA

M. Dopita,R. Sutherland,D. Nicholls,L. Kewley,F. Vogt

Published 2013 in The Astrophysical Journal Supplement Series

ABSTRACT

Recently, Nicholls et al., inspired by in situ observations of solar system astrophysical plasmas, suggested that the electrons in H ii regions are characterized by a κ-distribution of energies rather than a simple Maxwell–Boltzmann distribution. Here, we have collected together new atomic data within a modified photoionization code to explore the effects of both the new atomic data and the κ-distribution on the strong-line techniques used to determine chemical abundances in H ii regions. By comparing the recombination temperatures (Trec) with the forbidden line temperatures (TFL), we conclude that κ ∼ 20. While representing only a mild deviation from equilibrium, this result is sufficient to strongly influence abundances determined using methods that depend on measurements of the electron temperature from forbidden lines. We present a number of new emission line ratio diagnostics that cleanly separate the two parameters determining the optical spectrum of H ii regions—the ionization parameter q or and the chemical abundance, 12+log(O/H). An automated code to extract these parameters is presented. Using the homogeneous data set from van Zee et al., we find self-consistent results between all of these different diagnostics. The systematic errors between different line ratio diagnostics are much smaller than those found in the earlier strong-line work. Overall, the effect of the κ-distribution on the strong-line abundances derived solely on the basis of theoretical models is rather small.

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