Tracking defect type and strain relaxation in patterned Ge/Si(001) islands by x-ray forbidden reflection analysis

No abstract is available for this paper.

• Publication year

  2011

• Venue

  Physical Review B

• Publication date

  2011-08-09

• Fields of study

  Materials Science, Physics, Engineering

• Identifiers
  DOI 10.1103/PHYSREVB.84.075314
• External record

  Open on Semantic Scholar

• Source metadata

  Semantic Scholar

• No claims are published for this paper.

• No concepts are published for this paper.

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