Gap junctions formed by connexins 26 and 32 alone and in combination are differently affected by applied voltage.

Luis C. Barrio,Luis C. Barrio,Tom Suchyna,T. Bargiello,Lie Xian Xu,Raymond S. Roginski,Michael V. L. Bennett,Bruce J. Nicholson

Published 1991 in Proceedings of the National Academy of Sciences of the United States of America

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