Quantum process tomography of a controlled-NOT gate.

J. O'Brien,G. Pryde,A. Gilchrist,D. James,N. Langford,T. Ralph,A. White

Published 2004 in Physical Review Letters

ABSTRACT

We demonstrate complete characterization of a two-qubit entangling process--a linear optics controlled-NOT gate operating with coincident detection--by quantum process tomography. We use a maximum-likelihood estimation to convert the experimental data into a physical process matrix. The process matrix allows an accurate prediction of the operation of the gate for arbitrary input states and a calculation of gate performance measures such as the average gate fidelity, average purity, and entangling capability of our gate, which are 0.90, 0.83, and 0.73, respectively.

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