Skip-scan: A methodology for test time reduction

No abstract is available for this paper.

• Publication year

  2016

• Venue

  International Symposium on VLSI Design and Test

• Publication date

  2016-05-01

• Fields of study

  Computer Science, Engineering

• Identifiers
  DOI 10.1109/ISVDAT.2016.8064869
• External record

  Open on Semantic Scholar

• Source metadata

  Semantic Scholar

• No claims are published for this paper.

• No concepts are published for this paper.

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