Detection of single-electron charging in an individual InAs quantum dot by noncontact atomic-force microscopy.

Single-electron charging in an individual InAs quantum dot was observed by electrostatic force measurements with an atomic-force microscope (AFM). The resonant frequency shift and the dissipated energy of an oscillating AFM cantilever were measured as a function of the tip-back electrode voltage, and the resulting spectra show distinct jumps when the tip was positioned above the dot. The observed jumps in the frequency shift, with corresponding peaks in dissipation, are attributed to a single-electron tunneling between the dot and the back electrode governed by the Coulomb blockade effect, and are consistent with a model based on the free energy of the system. The observed phenomenon may be regarded as the "force version" of the Coulomb blockade effect.

• Publication year

  2005

• Venue

  Physical Review Letters

• Publication date

  2005-01-11

• Fields of study

  Materials Science, Medicine, Physics

• Identifiers
  DOI 10.1103/PhysRevLett.94.056802arXiv cond-mat/0501272PMID 15783674
• External record

  Open on Semantic Scholar

• Source metadata

  Semantic Scholar, PubMed

• No claims are published for this paper.

• No concepts are published for this paper.

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