Physical Mechanism and Gate Insulator Material Dependence of Generation and Recovery of Negative-Bias Temperature Instability in p-MOSFETs

No abstract is available for this paper.

• Publication year

  2007

• Venue

  IEEE Transactions on Electron Devices

• Publication date

  2007-06-25

• Fields of study

  Chemistry, Materials Science, Physics, Engineering

• Identifiers
  DOI 10.1109/TED.2007.899425
• External record

  Open on Semantic Scholar

• Source metadata

  Semantic Scholar

• No claims are published for this paper.

• No concepts are published for this paper.

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