Impact of Scaling on Neutron-Induced Soft Error in SRAMs From a 250 nm to a 22 nm Design Rule

No abstract is available for this paper.

• Publication year

  2010

• Venue

  IEEE Transactions on Electron Devices

• Publication date

  2010-05-20

• Fields of study

  Physics, Engineering

• Identifiers
  DOI 10.1109/TED.2010.2047907
• External record

  Open on Semantic Scholar

• Source metadata

  Semantic Scholar

• No claims are published for this paper.

• No concepts are published for this paper.

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