Advanced Physical Inspection Methods for Counterfeit IC Detection

No abstract is available for this paper.

• Publication year

  2014

• Venue

  Unknown venue

• Publication date

  2014-11-01

• Fields of study

  Materials Science, Computer Science, Engineering

• Identifiers
  DOI 10.31399/ASM.CP.ISTFA2014P0055
• External record

  Open on Semantic Scholar

• Source metadata

  Semantic Scholar

• No claims are published for this paper.

• No concepts are published for this paper.

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