An extended class of sequential circuits with combinational test generation complexity

No abstract is available for this paper.

• Publication year

  2002

• Venue

  Proceedings. IEEE International Conference on Computer Design: VLSI in Computers and Processors

• Publication date

  2002-09-16

• Fields of study

  Computer Science, Engineering

• Identifiers
  DOI 10.1109/ICCD.2002.1106770
• External record

  Open on Semantic Scholar

• Source metadata

  Semantic Scholar

• No claims are published for this paper.

• No concepts are published for this paper.

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