Role of anode hole injection and valence band hole tunneling on interface trap generation during hot carrier injection stress

No abstract is available for this paper.

• Publication year

  2006

• Venue

  IEEE Electron Device Letters

• Publication date

  2006-06-26

• Fields of study

  Physics, Chemistry, Engineering

• Identifiers
  DOI 10.1109/LED.2006.876310
• External record

  Open on Semantic Scholar

• Source metadata

  Semantic Scholar

• No claims are published for this paper.

• No concepts are published for this paper.

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