On the generation and recovery of interface traps in MOSFETs subjected to NBTI, FN, and HCI stress

No abstract is available for this paper.

• Publication year

  2006

• Venue

  IEEE Transactions on Electron Devices

• Publication date

  2006-06-19

• Fields of study

  Physics, Chemistry, Engineering

• Identifiers
  DOI 10.1109/TED.2006.876041
• External record

  Open on Semantic Scholar

• Source metadata

  Semantic Scholar

• No claims are published for this paper.

• No concepts are published for this paper.

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