Measurements and analysis of process variability in 90nm CMOS

No abstract is available for this paper.

• Publication year

  2006

• Venue

  2006 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings

• Publication date

  2006-10-01

• Fields of study

  Materials Science, Computer Science, Engineering

• Identifiers
  DOI 10.1109/ICSICT.2006.306337
• External record

  Open on Semantic Scholar

• Source metadata

  Semantic Scholar

• No claims are published for this paper.

• No concepts are published for this paper.

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