We show that submicrometer silicon spheres, whose polarizabilities are completely given by their two first Mie coefficients, are an excellent laboratory to test effects of both angle-suppressed and resonant differential scattering cross sections. Specifically, outstanding scattering angular distributions, with zero forward- or backward-scattered intensity, (i.e., the so-called Kerker conditions), previously discussed for hypothetical magnetodielectric particles, are now observed for those Si objects in the near infrared. Interesting new consequences for the corresponding optical forces are derived from the interplay, both in and out of resonance, between the electric- and magnetic-induced dipoles.
Angle-suppressed scattering and optical forces on submicrometer dielectric particles.
M. Nieto-Vesperinas,R. Gómez-Medina,J. Sáenz
Published 2012 in Journal of The Optical Society of America A-optics Image Science and Vision
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- Publication year
2012
- Venue
Journal of The Optical Society of America A-optics Image Science and Vision
- Publication date
2012-01-30
- Fields of study
Medicine, Physics
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- Source metadata
Semantic Scholar, PubMed
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