Integrated Testing and Algorithms for Visual Inspection of Integrated Circuits

No abstract is available for this paper.

• Publication year

  1983

• Venue

  IEEE Transactions on Pattern Analysis and Machine Intelligence

• Publication date

  1983-06-01

• Fields of study

  Medicine, Computer Science, Engineering

• Identifiers
  DOI 10.1109/TPAMI.1983.4767449PMID 21869146
• External record

  Open on Semantic Scholar

• Source metadata

  Semantic Scholar, PubMed

• No claims are published for this paper.

• No concepts are published for this paper.

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