Time redundancy based soft-error tolerance to rescue nanometer technologies

No abstract is available for this paper.

• Publication year

  1999

• Venue

  Proceedings of the ... IEEE VLSI Test Symposium

• Publication date

  1999-04-26

• Fields of study

  Physics, Computer Science, Engineering

• Identifiers
  DOI 10.1109/VTEST.1999.766651
• External record

  Open on Semantic Scholar

• Source metadata

  Semantic Scholar

• No claims are published for this paper.

• No concepts are published for this paper.

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