Silicon Odometer: An On-Chip Reliability Monitor for Measuring Frequency Degradation of Digital Circuits

No abstract is available for this paper.

• Publication year

  2007

• Venue

  2007 IEEE Symposium on VLSI Circuits

• Publication date

  2007-06-14

• Fields of study

  Computer Science, Engineering

• Identifiers
  DOI 10.1109/JSSC.2008.917502
• External record

  Open on Semantic Scholar

• Source metadata

  Semantic Scholar

• No claims are published for this paper.

• No concepts are published for this paper.

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