Investigation on the SEL Sensitive Depth of an SRAM Using Linear and Two-Photon Absorption Laser Testing

No abstract is available for this paper.

• Publication year

  2011

• Venue

  IEEE Transactions on Nuclear Science

• Publication date

  2011-11-16

• Fields of study

  Physics, Engineering

• Identifiers
  DOI 10.1109/TNS.2011.2172222
• External record

  Open on Semantic Scholar

• Source metadata

  Semantic Scholar

• No claims are published for this paper.

• No concepts are published for this paper.

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